Surf. interface anal. 24 662 1995
WebSurface and Interface Analysis is devoted to the publication of papers dealing with the development and application of techniques for the characterization of surfaces, interfaces … WebNot Yet Imported: Journal of Electron Spectroscopy and Related Phenomena - journal-article : 10.1016/0368-2048(88)80019-7 If you would like this item imported into the Digital Library, please contact us quoting Journal ID 41359: Not Yet Imported: Journal of Electron Spectroscopy and Related Phenomena - journal-article : 10.1016/0368-2048(82)85041-X If …
Surf. interface anal. 24 662 1995
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WebSecond harmonic spectroscopy of semiconductors 967 However, microscopic theory, which relates atomic-level structure to the non-linear source polarization, is only begin- WebBiomedical Chromatography; Drug Testing and Analysis; Electroanalysis; Electrophoresis; Journal of Applied Toxicology ; Journal of Chemometrics; Journal of Labelled Compounds …
WebJul 1, 1998 · Practical application of depth profiling at interfaces is further elucidated by typical examples in the fields of surface and grain boundary segregation, corrosion, … WebDec 1, 1997 · A series of nickel catalysts supported on pumice was prepared by precipitation and impregnation techniques. The influence of the calcination and reduction temperatures on the structural properties such as lattice parameters and particle dimensions of the oxide precursors and of the reduced catalysts was investigated by X-ray diffraction ...
WebJan 5, 2013 · We analyzed chemical composition and electron transport phenomena in surface and sub-surface region of hot-pressed TiN specimens using a combination of X-ray photoelectron spectroscopy (XPS) and elastic-peak …
WebMar 1, 1984 · Ebel M F 1979b Surf. Interface Anal. 1 58-62 . Crossref; Google Scholar Ebel M F 1980 Surf. Interface Anal. 2 173-8 . Crossref; Google Scholar Ebel M F 1981 Surf. Interface Anal. 3 173-5 . Crossref; Google Scholar Ebel M F, Ebel H and Hirokawa K 1982 Spectrochim. Acta. 37B 461-71 . Crossref; Google Scholar Ebel M F and Wernisch J 1977 Mikrochim ...
WebJul 1, 1993 · Abstract. In elastic recoil detection (ERD) one determines the yield and energy of particles ejected out of the surface region of samples under MeV ion bombardment. By application of this surface and thin film analysis technique one can obtain quantitative information concerning the depth distribution of light elements in a sample to be analysed. razor\u0027s anWebMay 1, 2024 · Cobalt reduces the interconnect structure and process complexity compared to the dual damascene process. In this article, we investigate the effects of complexing … d\u0027azemarWebMar 4, 2024 · TEM imaging revealed that Cu nanoparticles have an agglomerate-type morphology (Figure 2) with a nonhomogeneous particle size distribution as can be seen from Figure 2a, yet most of the particles fall between 30 and 110 nm according to the particle size histogram in Figure S7a, Supporting Information.Structural information from … d\\u0027azulisWebRatner, B.D. (1995) Advances in the analysis of surfaces of biomedical interest, Surf. Interface Anal. 23, 521–528. CrossRef Google Scholar. Garbassi, F., Morra, M., Occhiello, … d\u0027avolio kitchenWebOct 6, 2024 · The use of peak fitting to extract information from x-ray photoelectron spectroscopy (XPS) data is of growing use and importance. Due to increased instrument accessibility and reliability, the use of XPS instrumentation has significantly increased around the world. d\\u0027avogadroWebSep 26, 2001 · Chemical and thermal reduction of copper oxide thin films (∼20 Å) has been studied with x-ray photoelectron spectroscopy (XPS) and temperature programmed desorption (TPD) for application in microel... d\u0027avola grapeWebSep 15, 2012 · The NIST XPS Database gives access to energies of many photoelectron and Auger-electron spectral lines. The database contains over 29,000 line positions, chemical shifts, doublet splittings, and energy separations of photoelectron and Auger-electron lines. d\\u0027avola wine